Surface analysis : the principal techniques

=001  25137=005  20160603145829.2=008  080915s2009    enka     b    001 0 eng=010  \\$a2008040278=019  \\$a288986665=020  \\$a0470017635=020  \\$a0470017643 (pbk.)=020  \\$a9780470017630=020  \\$a9780470017647 (pbk.)=035  \\$a(OCoLC)254529018 $z(OCoLC)288986665=035  \\$a.b14468748=040  \\$aDLC $cDLC $dBTCTA $dBWKUK $dBWK $dWAU $dYDXCP $dOCLCQ $dUKM $dOCLCQ $dCDX $dCIT=041  ##$aeng=049  \\$aCITA=050  00$aTA418.7 $b.S726 2009=082  ##$a620/.44 $bS521F=245  00$aSurface analysis : $bthe principal techniques / $ceditors, John C. Vickerman, Ian S. Gilmore.=250  \\$a2nd ed.=260  \\$aChichester, U.K. : $bWiley, $c2009=300  \\$axix, 666 p. : $bill. (some col.) ; $c26 cm.=504  \\$aIncludes bibliographical references and index.=505  00$t1. Introduction $r/ John C. Vickerman -- $t1.1 How do we Define the Surface? -- $t1.2 How Many Atoms in a Surface? -- $t1.3 Information Required -- $t1.4 Surface Sensitivity -- $t1.5 Radiation Effects - Surface Damage -- $t1.6 Complexity of the Data -- $t2. Auger Electron Spectroscopy $r/ Hans Jörg Mathieu -- $t2.1 Introduction -- $t2.2 Principle of the Auger Process -- $t2.3 Instrumentation -- $t2.4 Quantitative Analysis.  -- $t2.5 Depth Profile Analysis -- $t2.6 Summary -- $t3. Electron Spectroscopy for Chemical Analysis $r/ Buddy D. Ratner and David G. Castner -- $t3.1 Overview -- $t3.2 X-ray Interaction with matter, the Photoelectron Effect and Photoemission from Solids.-- $t3.3 Binding Energy and the Chemical Shift -- $t3.4 Inelastic Mean Free Path and Sampling Depth -- $t3.5 Quantification -- $t3.6 Spectral Features -- $t3.7 Instrumentation -- $t3.8 Spectral Quality -- $t3.9 Depth Profiling -- $t3.10 X-Y Mapping and Imaging -- $t3.11 Chemical Derivatization -- $t3.12 Valence Band -- $t3.13 Perspectives -- $t3.14 Conclusions -- $t4. Molecular Surface Mass Spectrometry by SIMS $r/ John C. Vickerman -- $t4.1 Introduction -- $t4.2 Basic Concepts -- $t4.3 Experimental Requirements -- $t4.4 Secondary Ion Formation -- $t4.5 Modes of Analysis -- $t4.6 Ionization of the Sputtered Neutrals -- $t4.7 Ambient Methods of Desorption Mass Spectrometry.  -- $t5. Dynamic SIMS $r/ David McPhail and Mark Dowsett -- $t5.1 Fundamentals and Attributes -- $t5.2 Areas and Methods of Application -- $t5.3 Quantification of Data -- $t5.4 Novel Approaches -- $t5.5 Instrumentation -- $t5.6 Conclusions.  -- $t6. Low-Energy Ion Scattering and Rutherford Backscattering $r/ Edmund Taglauer -- $t6.1 Introduction -- $t6.2 Physical Basis -- $t6.3 Rutherford Backscattering -- $t6.4 Low-Energy Ion Scattering -- $t7. Vibrational Spectroscopy from Surfaces $r/ Martyn E. Pemble and Peter Gardner -- $t7.1 Introduction -- $t7.2 Infrared Spectroscopy from Surfaces -- $t7.3 Electron Energy Loss Spectroscopy (EELS) -- $t7.4 The Group Theory of Surface Vibrations -- $t7.5 Laser Raman Spectroscopy from Surfaces -- $t7.6 Inelastic Neutron Scattering  (INS) -- $t7.7 Sum-Frequency Generation Methods. References. Problems -- $t8. Surface Structure Determination by Interference Techniques $r/ Christopher A. Lucas -- $t8.1 Introduction -- $t8.2 Electron Diffraction Techniques -- $t8.3 X-ray Techniques -- $t8.4 Photoelectron Diffraction -- $t9. Scanning Probe Microscopy $r/ Graham J. Leggett -- $t9.1 Introduction -- $t9.2 Scanning Tunnelling Microscopy -- $t9.3 Atomic Force Microscopy -- $t9.4 Scanning Near-Field Optical Microscopy -- $t9.5 Other Scanning Probe Microscopy Techniques -- $t9.6 Lithography Using Probe Microscopy Methods -- $t9.7 Conclusions -- $t10. The Application of Multivariate Data Analysis Techniques in Surface Analysis $r/ Joanna L.S. Lee and Ian S. Gilmore -- $t10.1 Introduction -- $t10.2 Basic Concepts -- $t10.3 Factor Analysis for Identification -- $t10.4 Regression Methods for Quantification -- $t10.5 Methods for Classification -- $t10.6 Summary and Conclusion=650  \\$aSpectrum analysis=650  \\$aSurfaces (Technology) $xAnalysis=700  \1$aGilmore, Ian=700  \1$aVickerman, J. C=LDR  04259cam a22003734a 4500