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Surface analysis : the principal techniques
Gilmore, Ian, Vickerman, J. C · Chichester, U.K : Wiley, 2009
- Publisher
- Chichester, U.K : Wiley, 2009
- Physical description
- 666 pages
- ISBN
- 0470017635;0470017643 (pbk.);9780470017630;9780470017647 (pbk.)
- Dewey classification
- 620/.44
- Language
- English
Digital copy
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Catalogue record
| Field | Value |
|---|---|
| 001Control number | 25137 |
| 005Date and time of latest transaction | 3 Jun 2016, 14:58 |
| 008Fixed-length data elements | 080915s2009 enka b 001 0 eng |
| 010Library of Congress control number | 2008040278 |
| 020International Standard Book Number (ISBN) |
|
| 035System control number |
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| 040Cataloging source | DLC DLC BTCTA BWKUK BWK WAU YDXCP OCLCQ UKM OCLCQ CDX CIT |
| 041Language code | eng |
| 050Library of Congress call number | TA418.7 .S726 2009 |
| 082Dewey Decimal call number | 620/.44 S521F |
| 245Title statement | Surface analysis : the principal techniques / editors, John C. Vickerman, Ian S. Gilmore. |
| 250Edition statement | 2nd ed. |
| 260Publication, distribution, etc. (imprint) | Chichester, U.K. : Wiley, 2009 |
| 300Physical description | xix, 666 p. : ill. (some col.) ; 26 cm. |
| 504Bibliography, etc. note | Includes bibliographical references and index. |
| 505Formatted contents note | 1. Introduction / John C. Vickerman -- 1.1 How do we Define the Surface? -- 1.2 How Many Atoms in a Surface? -- 1.3 Information Required -- 1.4 Surface Sensitivity -- 1.5 Radiation Effects - Surface Damage -- 1.6 Complexity of the Data -- 2. Auger Electron Spectroscopy / Hans Jörg Mathieu -- 2.1 Introduction -- 2.2 Principle of the Auger Process -- 2.3 Instrumentation -- 2.4 Quantitative Analysis. -- 2.5 Depth Profile Analysis -- 2.6 Summary -- 3. Electron Spectroscopy for Chemical Analysis / Buddy D. Ratner and David G. Castner -- 3.1 Overview -- 3.2 X-ray Interaction with matter, the Photoelectron Effect and Photoemission from Solids.-- 3.3 Binding Energy and the Chemical Shift -- 3.4 Inelastic Mean Free Path and Sampling Depth -- 3.5 Quantification -- 3.6 Spectral Features -- 3.7 Instrumentation -- 3.8 Spectral Quality -- 3.9 Depth Profiling -- 3.10 X-Y Mapping and Imaging -- 3.11 Chemical Derivatization -- 3.12 Valence Band -- 3.13 Perspectives -- 3.14 Conclusions -- 4. Molecular Surface Mass Spectrometry by SIMS / John C. Vickerman -- 4.1 Introduction -- 4.2 Basic Concepts -- 4.3 Experimental Requirements -- 4.4 Secondary Ion Formation -- 4.5 Modes of Analysis -- 4.6 Ionization of the Sputtered Neutrals -- 4.7 Ambient Methods of Desorption Mass Spectrometry. -- 5. Dynamic SIMS / David McPhail and Mark Dowsett -- 5.1 Fundamentals and Attributes -- 5.2 Areas and Methods of Application -- 5.3 Quantification of Data -- 5.4 Novel Approaches -- 5.5 Instrumentation -- 5.6 Conclusions. -- 6. Low-Energy Ion Scattering and Rutherford Backscattering / Edmund Taglauer -- 6.1 Introduction -- 6.2 Physical Basis -- 6.3 Rutherford Backscattering -- 6.4 Low-Energy Ion Scattering -- 7. Vibrational Spectroscopy from Surfaces / Martyn E. Pemble and Peter Gardner -- 7.1 Introduction -- 7.2 Infrared Spectroscopy from Surfaces -- 7.3 Electron Energy Loss Spectroscopy (EELS) -- 7.4 The Group Theory of Surface Vibrations -- 7.5 Laser Raman Spectroscopy from Surfaces -- 7.6 Inelastic Neutron Scattering (INS) -- 7.7 Sum-Frequency Generation Methods. References. Problems -- 8. Surface Structure Determination by Interference Techniques / Christopher A. Lucas -- 8.1 Introduction -- 8.2 Electron Diffraction Techniques -- 8.3 X-ray Techniques -- 8.4 Photoelectron Diffraction -- 9. Scanning Probe Microscopy / Graham J. Leggett -- 9.1 Introduction -- 9.2 Scanning Tunnelling Microscopy -- 9.3 Atomic Force Microscopy -- 9.4 Scanning Near-Field Optical Microscopy -- 9.5 Other Scanning Probe Microscopy Techniques -- 9.6 Lithography Using Probe Microscopy Methods -- 9.7 Conclusions -- 10. The Application of Multivariate Data Analysis Techniques in Surface Analysis / Joanna L.S. Lee and Ian S. Gilmore -- 10.1 Introduction -- 10.2 Basic Concepts -- 10.3 Factor Analysis for Identification -- 10.4 Regression Methods for Quantification -- 10.5 Methods for Classification -- 10.6 Summary and Conclusion |
| 650Subject added entry – topical term |
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| 700Added entry – personal name |
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| 999Collection | Downloads |
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