Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis

Magonov, Sergei N · Weinheim New York : VCH, 1996

Publisher: Weinheim New York : VCH, 1996
Physical description: 323 pages
ISBN: 3527293132 (acid-free and chlorine-free paper)
Dewey classification: 621
Subjects: Atomic force microscopy Electric insulators and insulation--Testing Metals--Surfaces--Analysis Scanning tunneling microscopy Semiconductors--Testing Surfaces (Technology)--Analysis

Digital copy

Full textPDF · reads in your browser

Sign-in requiredRead

Catalogue record

Field	Value
001Control number	24541
003Control number identifier	OCoLC
005Date and time of latest transaction	6 Jun 2016, 10:46
008Fixed-length data elements	960326s1996 gw a b 001 0 eng d
020International Standard Book Number (ISBN)	3527293132 (acid-free and chlorine-free paper)
035System control number	CUA000140700
040Cataloging source	CWR CWR PBR AGL IQU
082Dewey Decimal call number	621 M101-O
090Local call number	QH212.S35 M3 1996
100Main entry – personal name	Magonov, Sergei N.
245Title statement	Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis / Sergei N. Magonov, Myung-Hwan Whangbo.
246Varying form of title	Experimental and theoretic aspects of image analysis. Image analysis.
260Publication, distribution, etc. (imprint)	Weinheim ; New York : VCH, 1996
300Physical description	xii, 323 p. : ill. ; 25 cm.
504Bibliography, etc. note	Includes bibliographical references and index.
650Subject added entry – topical term	Atomic force microscopy. Electric insulators and insulation--Testing. Metals--Surfaces--Analysis. Scanning tunneling microscopy. Semiconductors--Testing. Surfaces (Technology)--Analysis.
700Added entry – personal name	Whangbo, Myung-Hwan.
999Collection	Downloads

MARC21 record · 26 fields

=001  24541=003  OCoLC=005  20160606104624.0=008  960326s1996    gw a     b    001 0 eng d=020  \\$a3527293132 (acid-free and chlorine-free paper)=035  \\$aCUA000140700=040  \\$aCWR $cCWR $dPBR $dAGL $dIQU=049  \\$aCVUA=082  ##$a621 $bM101-O=090  \\$aQH212.S35 $bM3 1996=100  1\$aMagonov, Sergei N.=245  10$aSurface analysis with STM and AFM : $bexperimental and theoretical aspects of image analysis / $cSergei N. Magonov, Myung-Hwan Whangbo.=246  30$aExperimental and theoretic aspects of image analysis.=246  30$aImage analysis.=260  \\$aWeinheim ; $aNew York : $bVCH, $c1996=300  \\$axii, 323 p. : $bill. ; $c25 cm.=504  \\$aIncludes bibliographical references and index.=650  \0$aAtomic force microscopy.=650  \0$aElectric insulators and insulation $xTesting.=650  \0$aMetals $xSurfaces $xAnalysis.=650  \0$aScanning tunneling microscopy.=650  \0$aSemiconductors $xTesting.=650  \0$aSurfaces (Technology) $xAnalysis.=700  1\$aWhangbo, Myung-Hwan.=910  \\$a980805/w/n;hc,hc=LDR  01284cam a2200361 a 4500