Downloads
Digital logic testing and simulation
Miczo, Alexander · Hoboken, N.J : Wiley-Interscience, 2003
- Publisher
- Hoboken, N.J : Wiley-Interscience, 2003
- Physical description
- 673 pages
- ISBN
- 0471439959;0471457787 (electronic bk.);9780471439950;9780471457787 (electronic bk.)
- Dewey classification
- 621.381548
- Subjects
- Digital electronics--Testing
- Language
- English
Digital copy
Full textPDF · reads in your browser
Sign-in requiredRead
Catalogue record
| Field | Value |
|---|---|
| 001Control number | 14787 |
| 005Date and time of latest transaction | 4 Jan 2011, 15:36 |
| 006Fixed-length data elements – additional material characteristics | m d |
| 007Physical description fixed field | cr cnu|||||||| |
| 008Fixed-length data elements | 030107s2003 njua sb 001 0 eng d |
| 020International Standard Book Number (ISBN) |
|
| 035System control number | (OCoLC)85819930 |
| 040Cataloging source | DG1 DG1 HNK |
| 041Language code | eng |
| 082Dewey Decimal call number | 621.381548 Dig-S |
| 090Local call number | TK7868.D5 M53 2003eb |
| 100Main entry – personal name | Miczo, Alexander. |
| 245Title statement | Digital logic testing and simulation [electronic resource] / Alexander Miczo. |
| 250Edition statement | 2nd ed. |
| 260Publication, distribution, etc. (imprint) | Hoboken, N.J. : Wiley-Interscience, 2003 |
| 300Physical description | xxii, 673 p. : ill. ; 25 cm. |
| 500General note | "A John Wiley & Sons, Inc., publication." |
| 504Bibliography, etc. note | Includes bibliographical references and index. |
| 506Restrictions on access note | Access restricted to subscribers. |
| 533Reproduction note | Electronic reproduction. Somerset, N.J. : Wiley InterScience, c2003. System requirements: Adobe Acrobat Reader. Mode of access: World Wide Web. Made available through Wiley InterScience. |
| 650Subject added entry – topical term | Digital electronics--Testing. |
| 740Added entry – uncontrolled related/analytical title | Wiley Online Library. |
| 776Additional physical form entry | Original 0471439959 (DLC) 2003041100. |
| 999Collection | Downloads |
=001 14787=005 20110104153651.8=006 m d=007 cr cnu||||||||=008 030107s2003 njua sb 001 0 eng d=020 ##$a0471439959=020 ##$a0471457787 (electronic bk.)=020 ##$a9780471439950=020 ##$a9780471457787 (electronic bk.)=035 ##$a(OCoLC)85819930=040 ##$aDG1 $cDG1 $dHNK=041 0#$aeng=049 ##$aHNKA=082 ##$a621.381548 $bDig-S=090 ##$aTK7868.D5 $bM53 2003eb=100 1#$aMiczo, Alexander.=245 10$aDigital logic testing and simulation $h[electronic resource] / $cAlexander Miczo.=250 ##$a2nd ed.=260 ##$aHoboken, N.J. : $bWiley-Interscience, $c2003=300 ##$axxii, 673 p. : $bill. ; $c25 cm.=500 ##$a"A John Wiley & Sons, Inc., publication."=504 ##$aIncludes bibliographical references and index.=506 ##$aAccess restricted to subscribers.=533 ##$aElectronic reproduction. $bSomerset, N.J. : $cWiley InterScience, $dc2003. $nSystem requirements: Adobe Acrobat Reader. $nMode of access: World Wide Web. $nMade available through Wiley InterScience.=650 #0$aDigital electronics $xTesting.=740 0#$aWiley Online Library.=776 1#$cOriginal $z0471439959 $w(DLC) 2003041100.=910 ##$alfs=948 ##$a.b9958435=LDR 01450nam a2200409Ia 4500

