Leakage in Nanometer CMOS Technologies

Chandrakasan, Anantha, Narendra, Siva G, SpringerLink (Online service) · Boston, MA : Springer Science+Business Media, Inc, 2006

Publisher: Boston, MA : Springer Science+Business Media, Inc, 2006
ISBN: 9780387257372 (paper);9780387281339 (electronic bk.)
Dewey classification: 621.38412
Subjects: Electric leakage--Prevention Integrated circuits--Design and construction Metal oxide semiconductors, Complementary--Design and construction
Language: English

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Catalogue record

Field	Value
001Control number	25646
003Control number identifier	Springer
005Date and time of latest transaction	18 Dec 2013, 15:38
006Fixed-length data elements – additional material characteristics	m d
007Physical description fixed field	cr nn 008mamaa
008Fixed-length data elements	070822s2006 nyu s j eng d
020International Standard Book Number (ISBN)	9780387257372 (paper) 9780387281339 (electronic bk.)
041Language code	eng
082Dewey Decimal call number	621.38412 22
090Local call number	TK7871.99.M44 L435 2006eb
245Title statement	Leakage in Nanometer CMOS Technologies [electronic resource] / edited by Siva G. Narendra, Anantha Chandrakasan.
260Publication, distribution, etc. (imprint)	Boston, MA : Springer Science+Business Media, Inc., 2006
440Series statement / added entry – title	Series on Integrated Circuits and Systems, 1558-9412.
533Reproduction note	Electronic reproduction. Berlin : Springer, [200-] System requirements: Adobe Acrobat Reader. Available via World Wide Web.
650Subject added entry – topical term	Electric leakage--Prevention. Integrated circuits--Design and construction. Metal oxide semiconductors, Complementary--Design and construction.
700Added entry – personal name	Chandrakasan, Anantha. Narendra, Siva G.
710Added entry – corporate name	SpringerLink (Online service)
730Added entry – uniform title	SpringerLink books.
999Collection	Downloads

MARC21 record · 25 fields

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