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Fundamentals of semiconductor manufacturing and process control

May, Gary S · [Piscataway] : IEEE Hoboken, N.J : Wiley-Interscience, 2006

Publisher
[Piscataway] : IEEE Hoboken, N.J : Wiley-Interscience, 2006
Physical description
463 pages
ISBN
0471784060 (cloth : alk. paper);9780471784067
Dewey classification
621.38152
Language
English

Digital copy

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Catalogue record

FieldValue
001Control number14016
005Date and time of latest transaction12 Jan 2011, 10:11
008Fixed-length data elements050928s2006 njua b 001 0 eng
010Library of Congress control number2005028448
015National bibliography numberGBA627486 bnb
016National bibliographic agency control number013414729 Uk
020International Standard Book Number (ISBN)
  • 0471784060 (cloth : alk. paper)
  • 9780471784067
035System control number(OCoLC)ocm61821738
040Cataloging sourceDLC DLC UKM BAKER C#P COO DLC
041Language codeeng
042Authentication codepcc
050Library of Congress call numberTK7871.85 .M379 2006
082Dewey Decimal call number621.38152 Fun-C
100Main entry – personal nameMay, Gary S.
245Title statementFundamentals of semiconductor manufacturing and process control / Gary S. May, Costas J. Spanos.
260Publication, distribution, etc. (imprint)[Piscataway] : IEEE ; Hoboken, N.J. : Wiley-Interscience, 2006
300Physical descriptionxix, 463 p. : ill. ; 25 cm.
504Bibliography, etc. noteIncludes bibliographical references and index.
650Subject added entry – topical term
  • Integrated circuits--Design and construction.
  • Process control--Statistical methods.
  • Semiconductors--Design and construction.
700Added entry – personal nameSpanos, Costas J.
999CollectionDownloads